| |
1.
Overview
Transmission electron microscopy (TEM) is a microscopy technique whereby a beam of electrons is transmitted through an ultra thin specimen, interacting with the specimen as it passes through. An image is formed from the interaction of the electrons transmitted through the specimen; the image is magnified and focused onto an imaging device, such as a fluorescnet screen, on a layer of photographic film, or to be detected by a sensor such as a CCD camera.
 |
|
| |
2. TEM analysis
 
(a) Cross sectional TEM images of the thin film battery and (b) HTEM image of the interface between the
LiPON and the V2O5 film. [JKCS, 38, 3, 274, H. K Kim, T.Y. Seong, etc.]
 
The TED patterns obtained from (a) the as-deposited V2O5 film regions and (b) the 450th cycled V2O5
film.
[JKCS, 38, 3, 274, H. K Kim, T.Y. Seong, etc.]
|
|
